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Lornet-0836 - Double probing frequency non-linear junction detector

The non-linear junction detector LORNET-0836 is the indispensable tool for quick and reliable detection of devices containing semiconductor components. It can be used for counter-surveilance search works in premises (covert transmitters identification), as well as for location of explosive devices outdoors. The DPF (double probing frequency) technology with a patent pending antenna system places it truly apart from the competition.
 
 Main competitive advantages:
Duoble probing frequency operation mode gives Lornet-0836 significant advantages over single frequency NLJD since it is much better to detect small-sized and high-frequency semiconductor objects at high frequencies whereas the use of low frequencies benefits from improved detection in the wet ground and concrete walls;
It is possible to operate in one of the frequency ranges and in both of them simultaneously; 
An embedded parabolic antenna with high gain (20 dB at 3600 MHz) enables highly precise detection of semiconductor components from a ling distance (up to 10 m);
Laser pinpointing for a space selective object localisation;
Wide power control range, automatic and manual modes of probing signal level adjustment;
Possibility to listen to the envelope detector output as well as to the received signal level via a built-in loudspeaker and wireless head phones to evaluate parametric impacts (e.g. knocking) on the suspicious object.
Technical characteristics:
Type of probing signal pulse
First probing signal frequency 789,5 ... 791,5 MHz
Second probing signal frequency 3581,5 ... 3607,5 MHz
Duty cycle 0,3 % and 5%
Transmitters peak power in each frequency range 40 W / 20 W
Receivers sensitivity <-110 dBm
Operation time with changeable battery
(duty cycle 0,3% and 5%)
>3.0 / 1,5 h
Dimmensions 305 mm x 305 mm x 280 mm
Weight <1,6 kg
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