Catalog

Lornet-0836 – Double probing frequency non-linear junction detector

The non-linear junction detector LORNET-0836 is the indispensable tool for quick and reliable detection of devices containing semiconductor components. It can be used for counter-surveillance search works in premises (covert transmitters identification), as well as for location of explosive devices outdoors. The DPF (double probing frequency) technology with a patent pending antenna system places it truly apart from the competition.

Main competitive advantages:

• Double probing frequency operation mode gives Lornet-0836 significant advantages over single frequency NLJD since it is much better to detect small-sized and high-frequency semiconductor objects at high frequencies whereas the use of low frequencies benefits from improved detection in the wet ground and concrete walls;

• It is possible to operate in one of the frequency ranges and in both of them simultaneously;

• An embedded parabolic antenna with high gain (20 dB at 3600 MHz) enables highly precise detection of semiconductor components from a long-distance (up to 10 m);

• Laser pinpointing for space selective object localization;

• Wide power control range, automatic and manual modes of probing signal level adjustment;

• Possibility to listen to the envelope detector output as well as to the received signal level via a built-in loudspeaker and wireless headphones to evaluate parametric impacts (e.g. knocking) on the suspicious object.

Technical Characteristics
Type of probing signal	Pulse
First probing signal frequency	789,5 … 791,5 MHz
Second probing signal frequency	3581,5 … 3607,5 MHz
Duty cycle	0,3 % and 5%
Transmitter`s peak power in each frequency range	40 W / 20 W
Receiver`s sensitivity	< -110 dBm
Operation time with changeable battery (duty cycle 0,3% and 5%)	> 3.0 / 1,5 h
Dimensions	305 x 305 x 280 mm
Weight	< 1.6 Kg

Catalog

Lornet-0836 – Double probing frequency non-linear junction detector

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